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KMID : 0381920150450040218
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Korean Journal of Microscopy
2015 Volume.45 No. 4 p.218 ~ p.224
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Technical Overview on the Electron Backscattered Diffraction Sample Preparation
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Kim Dong-Ik
Kim Byung-Kyu
Kim Ju-Heon
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Abstract
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A technical overview on the various sample preparation methods for electron backscattered diffraction (EBSD) analysis is carried out. The mechanical polishing with colloidal silica fi nish, electro-chemical polishing, dual layer coating and ion beam milling are introduced for the common sample preparation methods for EBSD observation and some issues that are frequently neglected by the common EBSD users but should be considered to get a reliable EBSD data are discussed. This overview would be especially helpful to the people who know what EBSD technique is but do not get a reliable EBSD data because of diffi culties in sample preparation.
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KEYWORD
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Electron backscattered diffraction, Sample preparation, Mechanical polishing, Electro-chemical polishing, Ion milling
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